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Electromagnet variable temperature variable field Hall test system HSEM series
HSEM series electromagnet Hall effect test system is composed of electromagnet, Hall tester, controller, sample temperature variable option and so on。There is a continuously variable magnetic field environment, optional ±0.8T或±1.5T two configurations, with a rich temperature options, including: room temperature, liquid nitrogen single point, 10K-400K closed cycle low temperature options, room temperature -1273K high temperature options。
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Hall test system HSEM-06PS for electromagnet probe table with variable temperature and variable field
HSEM-06PS Room temperature variable field probe station Hall test system can place 4 inch wafer samples, using porous partition controlled gas adsorption fixed, can provide variable magnetic field environment, magnetic field size ±0.6T, can be installed 6 probe arms。External connection Other electrical meters can perform non-destructive electrical testing of chips, wafers and devices at room temperature, such as current, voltage, resistance and other electrical signals under different magnetic fields。
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